The offset-compensated Hall effect sensor comprises a semiconductor wafer (1) with n-type hopping conduction. On the one side of wafer is formed a Hall effect sensor (2), as on two of its opposite sides there is one ohmic power contact (3 and 4), and on two other opposite sides, located at 90o to those with the power contacts (3 and 4) - one ohmic measuring contact (5 and 6). The contacts (3 and 4) are connected to the two terminals of the current source (7), as the measured magnetic field (9) is perpendicular to the plane of the wafer (1). Contacts (5 and 6) are the output (8) of the Hall effect sensor with compensated offset. There is also a coil (10) with a small number of windings formed on the plane of the wafer (1) and completely covering the sensor (2), as generated by it magnetic field (11) is perpendicular to the plane of the sensor (2). In series through a switch (12) and through an adjustable resistor (13) the coil (10) is connected to the terminals of the current source (7).
