The interferometric system finds application for measuring the full field of in-plane and out-of-plane displacements of tested samples with high accuracy during their loading and upon changes in their mechanical characteristics. The interferometric system consists of two pairs of diode lasers (1; 3) and (2; 4) in the horizontal (x, 0, z) and vertical (0, y, z) planes, positioned symmetrically and independently, powered by a stabilized current source (15) connected to a control computer. Replaceable sinusoidal phase gratings (5) are arranged along the direction of the light emitted by the diode lasers, as well as a replaceable four-exposure reflection holographic optical element (6), which is positioned in close proximity to the studied object (7) during interferometric measurements. The pairs of diode lasers feature linearly polarized light emitted at two different wavelengths in both the horizontal and vertical planes. The four-exposure reflection holographic optical element (6) represents a "sandwich" of two double-exposure reflection holograms on the same reference plane (a diffusely reflecting screen), stacked with their light-sensitive layers facing each other in a common package, each of which reconstructs the recorded screen for each of the two wavelengths and polarizations of the diode lasers.
